Capacitive Measurements of SiO2 Films of Different Thicknesses Using a MOSFET-Based SPM Probe

Hoontaek Lee, Kumjae Shin, Wonkyu Moon. Capacitive Measurements of SiO2 Films of Different Thicknesses Using a MOSFET-Based SPM Probe. Sensors, 21(11):4073, 2021. [doi]

Abstract

Abstract is missing.