External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Electric Field Impact on Lateral Charge Diffusivity in Charge Trapping 3D NAND Flash Memory

Juwon Lee, Junho Seo, Jeonghun Nam, YongLae Kim, Ki-Whan Song, Jai Hyuk Song, Woo-Young Choi. Electric Field Impact on Lateral Charge Diffusivity in Charge Trapping 3D NAND Flash Memory. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 29-1, IEEE, 2022. [doi]

Authors

Juwon Lee

This author has not been identified. Look up 'Juwon Lee' in Google

Junho Seo

This author has not been identified. Look up 'Junho Seo' in Google

Jeonghun Nam

This author has not been identified. Look up 'Jeonghun Nam' in Google

YongLae Kim

This author has not been identified. Look up 'YongLae Kim' in Google

Ki-Whan Song

This author has not been identified. Look up 'Ki-Whan Song' in Google

Jai Hyuk Song

This author has not been identified. Look up 'Jai Hyuk Song' in Google

Woo-Young Choi

This author has not been identified. Look up 'Woo-Young Choi' in Google
runs on