Juwon Lee, Junho Seo, Jeonghun Nam, YongLae Kim, Ki-Whan Song, Jai Hyuk Song, Woo-Young Choi. Electric Field Impact on Lateral Charge Diffusivity in Charge Trapping 3D NAND Flash Memory. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 29-1, IEEE, 2022. [doi]
Abstract is missing.