Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chen-Lun Lee. A Multi-dimensional Pattern Run-Length Method for Test Data Compression. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 325-330, IEEE Computer Society, 2009. [doi]
@inproceedings{LeeTLL09,
title = {A Multi-dimensional Pattern Run-Length Method for Test Data Compression},
author = {Lung-Jen Lee and Wang-Dauh Tseng and Rung-Bin Lin and Chen-Lun Lee},
year = {2009},
doi = {10.1109/ATS.2009.49},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.49},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/LeeTLL09},
cites = {0},
citedby = {0},
pages = {325-330},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3864-8},
}