Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chi-Wei Yu. Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 111-116, IEEE Computer Society, 2009. [doi]
Abstract is missing.