Lung-Jen Lee, Wang-Dauh Tseng, Wen-Ting Yang. Dual-LFSR Reseeding for Low Power Testing. In 13th International Workshop on Microprocessor Test and Verification, MTV 2012, Austin, TX, USA, December 10-13, 2012. pages 30-34, IEEE Computer Society, 2012. [doi]
Abstract is missing.