C. S. Lee, P. Vaitheeswaran, G. Subbarayan, Y. J. Park, J. Chung, S. Krishnan. Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.