Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir. Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
Abstract is missing.