Seongkwan Lee, Jun Yeon Won, Cheolmin Park, Minho Kang, Jaemoo Choi. Method for Diagnosing Channel Damage Using FPGA Transceiver. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 71-76, IEEE, 2023. [doi]
@inproceedings{LeeWPKC23,
title = {Method for Diagnosing Channel Damage Using FPGA Transceiver},
author = {Seongkwan Lee and Jun Yeon Won and Cheolmin Park and Minho Kang and Jaemoo Choi},
year = {2023},
doi = {10.1109/ITC51656.2023.00019},
url = {https://doi.org/10.1109/ITC51656.2023.00019},
researchr = {https://researchr.org/publication/LeeWPKC23},
cites = {0},
citedby = {0},
pages = {71-76},
booktitle = {IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4325-0},
}