Seongkwan Lee, Jun Yeon Won, Cheolmin Park, Minho Kang, Jaemoo Choi. Method for Diagnosing Channel Damage Using FPGA Transceiver. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 71-76, IEEE, 2023. [doi]
Abstract is missing.