Substrate cross talk noise characterization and prevention in 0.35 mμm CMOS technology

John P. Z. Lee, Frank Wang, Abhijit Phanse, Linda C. Smith. Substrate cross talk noise characterization and prevention in 0.35 mμm CMOS technology. In Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, CICC 1999, San Diego, CA, USA, May 1649,1999. pages 479-482, IEEE, 1999. [doi]

Abstract

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