Fast WAT test structure for measuring Vt variance based on latch-based comparators - researchr publication authors

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Kao-Chi Lee, Kai-Chiang Wu, Chih-Ying Tsai, Mango Chia-Tso Chao. Fast WAT test structure for measuring Vt variance based on latch-based comparators. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1-6, IEEE, 2017. [doi]

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