Kao-Chi Lee, Kai-Chiang Wu, Chih-Ying Tsai, Mango Chia-Tso Chao. Fast WAT test structure for measuring Vt variance based on latch-based comparators. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{LeeWTC17,
title = {Fast WAT test structure for measuring Vt variance based on latch-based comparators},
author = {Kao-Chi Lee and Kai-Chiang Wu and Chih-Ying Tsai and Mango Chia-Tso Chao},
year = {2017},
doi = {10.1109/VTS.2017.7928928},
url = {https://doi.org/10.1109/VTS.2017.7928928},
researchr = {https://researchr.org/publication/LeeWTC17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017},
publisher = {IEEE},
isbn = {978-1-5090-4482-5},
}