Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production

T.-Y. Lee, K. Yamane, L. Y. Hau, R. Chao, N. L. Chung, V. B. Naik, K. Sivabalan, J. Kwon, J.-H. Lim, Wah-Peng Neo, Kevin Khua, N. Thiyagarajah, S. H. Jang, B. Behin-Aein, E. H. Toh, Y. Otani, D. Zeng, N. Balasankaran, L. C. Goh, T. Ling, J. Hwang, L. Zhang, R. Low, S. L. Tan, C. S. Seet, J. W. Ting, S. Ong, Y. S. You, S. T. Woo, E. Quek, S. Y. Siah. Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-4, IEEE, 2020. [doi]

Abstract

Abstract is missing.