Multiple shift-vector importance sampling method using support vector machine and clustering for high-density DRAM designs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jinyoung Lee, Sunghee Yun, Jeongha Kim, Dongsoo Kang, Jeongyeol Kim, Sanghoon Lee. Multiple shift-vector importance sampling method using support vector machine and clustering for high-density DRAM designs. In 17th International Symposium on Quality Electronic Design, ISQED 2016, Santa Clara, CA, USA, March 15-16, 2016. pages 430-436, IEEE, 2016. [doi]

This author has not been identified. Look up 'Jinyoung Lee' in GoogleThis author has not been identified. Look up 'Sunghee Yun' in GoogleThis author has not been identified. Look up 'Jeongha Kim' in GoogleThis author has not been identified. Look up 'Dongsoo Kang' in GoogleThis author has not been identified. Look up 'Jeongyeol Kim' in GoogleThis author has not been identified. Look up 'Sanghoon Lee' in Google

runs on WebDSL