Multiple shift-vector importance sampling method using support vector machine and clustering for high-density DRAM designs - researchr publication

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Jinyoung Lee, Sunghee Yun, Jeongha Kim, Dongsoo Kang, Jeongyeol Kim, Sanghoon Lee. Multiple shift-vector importance sampling method using support vector machine and clustering for high-density DRAM designs. In 17th International Symposium on Quality Electronic Design, ISQED 2016, Santa Clara, CA, USA, March 15-16, 2016. pages 430-436, IEEE, 2016. [doi]

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