Hakjin Lee, Hyunsang Youn, Eunseok Lee. Automatic Detection of Design Pattern for Reverse Engineering. In 5th ACIS International Conference on Software Engineering Research, Management & Applications (SERA 2007), August 20-22, 2007, Haeundae Grand Hotel, Busan, Korea. pages 577-583, IEEE Computer Society, 2007. [doi]
@inproceedings{LeeYL07:1, title = {Automatic Detection of Design Pattern for Reverse Engineering}, author = {Hakjin Lee and Hyunsang Youn and Eunseok Lee}, year = {2007}, doi = {10.1109/SERA.2007.58}, url = {http://doi.ieeecomputersociety.org/10.1109/SERA.2007.58}, tags = {reverse engineering, design}, researchr = {https://researchr.org/publication/LeeYL07%3A1}, cites = {0}, citedby = {0}, pages = {577-583}, booktitle = {5th ACIS International Conference on Software Engineering Research, Management & Applications (SERA 2007), August 20-22, 2007, Haeundae Grand Hotel, Busan, Korea}, publisher = {IEEE Computer Society}, }