Hakjin Lee, Hyunsang Youn, Eunseok Lee. Automatic Detection of Design Pattern for Reverse Engineering. In 5th ACIS International Conference on Software Engineering Research, Management & Applications (SERA 2007), August 20-22, 2007, Haeundae Grand Hotel, Busan, Korea. pages 577-583, IEEE Computer Society, 2007. [doi]
Abstract is missing.