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Automatic Detection of Design Pattern for Reverse Engineering

Hakjin Lee, Hyunsang Youn, Eunseok Lee. Automatic Detection of Design Pattern for Reverse Engineering. In 5th ACIS International Conference on Software Engineering Research, Management & Applications (SERA 2007), August 20-22, 2007, Haeundae Grand Hotel, Busan, Korea. pages 577-583, IEEE Computer Society, 2007. [doi]

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