ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM

Hayoung Lee, Younwoo Yoo, Seung-Ho Shin, Sungho Kang. ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM. IEEE Trans. VLSI Syst., 30(6):781-793, 2022. [doi]

Authors

Hayoung Lee

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Younwoo Yoo

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Seung-Ho Shin

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Sungho Kang

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