ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM

Hayoung Lee, Younwoo Yoo, Seung-Ho Shin, Sungho Kang. ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM. IEEE Trans. VLSI Syst., 30(6):781-793, 2022. [doi]

Abstract

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