Larkhoon Leem, Hyungmin Cho, Hsiao-Heng Lee, Young Moon Kim, Yanjing Li, Subhasish Mitra. Cross-layer error resilience for robust systems. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 177-180, IEEE, 2010. [doi]
@inproceedings{LeemCLKLM10,
title = {Cross-layer error resilience for robust systems},
author = {Larkhoon Leem and Hyungmin Cho and Hsiao-Heng Lee and Young Moon Kim and Yanjing Li and Subhasish Mitra},
year = {2010},
doi = {10.1109/ICCAD.2010.5654129},
url = {http://dx.doi.org/10.1109/ICCAD.2010.5654129},
researchr = {https://researchr.org/publication/LeemCLKLM10},
cites = {0},
citedby = {0},
pages = {177-180},
booktitle = {2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA},
publisher = {IEEE},
}