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Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations

Yibo Lei, Jian Fang, Yingdong Liang, Yisen Zhang, Ling Yan, Lingli Tang, Xihe Yang, Bo Zhang 0027. Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations. Microelectronics Journal, 132:105692, February 2023. [doi]

Authors

Yibo Lei

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Jian Fang

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Yingdong Liang

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Yisen Zhang

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Ling Yan

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Lingli Tang

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Xihe Yang

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Bo Zhang 0027

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