Yibo Lei, Jian Fang, Yingdong Liang, Yisen Zhang, Ling Yan, Lingli Tang, Xihe Yang, Bo Zhang 0027. Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations. Microelectronics Journal, 132:105692, February 2023. [doi]
Abstract is missing.