Jun-Yang Lei, Thomas Moon, Justin Chow, Suresh K. Sitaraman, Abhijit Chatterjee. A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 191-196, IEEE, 2018. [doi]
Abstract is missing.