A unified solution to reduce test power and test volume for Test-per-scan schemes

ShaoChong Lei, Zhen Wang, Zeye Liu, Feng Liang. A unified solution to reduce test power and test volume for Test-per-scan schemes. IEICE Electronic Express, 7(18):1364-1369, 2010. [doi]

Authors

ShaoChong Lei

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Zhen Wang

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Zeye Liu

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Feng Liang

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