ShaoChong Lei, Zhen Wang, Zeye Liu, Feng Liang. A unified solution to reduce test power and test volume for Test-per-scan schemes. IEICE Electronic Express, 7(18):1364-1369, 2010. [doi]
@article{LeiWLL10a,
title = {A unified solution to reduce test power and test volume for Test-per-scan schemes},
author = {ShaoChong Lei and Zhen Wang and Zeye Liu and Feng Liang},
year = {2010},
doi = {10.1587/elex.7.1364},
url = {http://dx.doi.org/10.1587/elex.7.1364},
researchr = {https://researchr.org/publication/LeiWLL10a},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {7},
number = {18},
pages = {1364-1369},
}