Brian S. Leibowitz, Jaeha Kim, Jihong Ren, Chris J. Madden. Characterization of random decision errors in clocked comparators. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 691-694, IEEE, 2008. [doi]
Abstract is missing.