Algorithms for Routing and Testing Routability of Planar VLSI Layouts

Charles E. Leiserson, F. Miller Maley. Algorithms for Routing and Testing Routability of Planar VLSI Layouts. In Proceedings of the Seventeenth Annual ACM Symposium on Theory of Computing, 6-8 May 1985, Providence, Rhode Island, USA. pages 69-78, ACM, 1985.

Abstract

Abstract is missing.