Patrick M. Lenahan, E. B. Frantz, Sean W. King, Mark A. Anders 0002, S. J. Moxim, James P. Ashton, Kyle J. Myers, M. E. Flatté, N. J. Harmon. Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.