David P. Lerner, Benson Inkley, Shubhada H. Sahasrabudhe, Ethan Hansen, Luis D. Rojas Munoz, Arjan van de Ven. Optimization of Tests for Managing Silicon Defects in Data Centers. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 578-582, IEEE, 2022. [doi]
Abstract is missing.