Damien Leroy, Stanislaw J. Piestrak, Fabrice Monteiro, Abbas Dandache. Modeling of Transients Caused by a Laser Attack on Smart Cards. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 193-194, IEEE Computer Society, 2005. [doi]
Abstract is missing.