Damien Leroy, Stanislaw J. Piestrak, Fabrice Monteiro, Abbas Dandache, Stéphane Rossignol, Pascal Moitrel. Characterizing Laser-Induced Pulses in ICs: Methodology and Results. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 11-16, IEEE Computer Society, 2006. [doi]
Abstract is missing.