Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren. Characterization of Gain Enhanced In-Field Defects in Digital Imagers. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 155-163, IEEE Computer Society, 2009. [doi]
@inproceedings{LeungCKK09,
title = {Characterization of Gain Enhanced In-Field Defects in Digital Imagers},
author = {Jenny Leung and Glenn H. Chapman and Israel Koren and Zahava Koren},
year = {2009},
doi = {10.1109/DFT.2009.49},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2009.49},
researchr = {https://researchr.org/publication/LeungCKK09},
cites = {0},
citedby = {0},
pages = {155-163},
booktitle = {24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA},
editor = {Dimitris Gizopoulos and Susumu Horiguchi and Spyros Tragoudas and Mohammad Tehranipoor},
publisher = {IEEE Computer Society},
}