Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren. Characterization of Gain Enhanced In-Field Defects in Digital Imagers. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 155-163, IEEE Computer Society, 2009. [doi]
Abstract is missing.