Quantitative Analysis of In-Field Defects in Image Sensor Arrays - researchr publication authors

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Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren. Quantitative Analysis of In-Field Defects in Image Sensor Arrays. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 526-534, IEEE Computer Society, 2007. [doi]

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