Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren. Quantitative Analysis of In-Field Defects in Image Sensor Arrays. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 526-534, IEEE Computer Society, 2007. [doi]
Abstract is missing.