Kobi Levi, Yair Weiss. Learning Object Detection from a Small Number of Examples: The Importance of Good Features. In 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2004), with CD-ROM, 27 June - 2 July 2004, Washington, DC, USA. pages 53-60, IEEE Computer Society, 2004. [doi]
Abstract is missing.