Ilya Levin, Vladimir Sinelnikov, Mark G. Karpovsky, Sergey Ostanin. Sequential Circuits Applicable for Detecting Different Types of Faults. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 44, IEEE Computer Society, 2002. [doi]
Abstract is missing.