Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards

Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks. Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 541-547, IEEE Computer Society, 1982.

Abstract

Abstract is missing.