Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks. Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 541-547, IEEE Computer Society, 1982.
Abstract is missing.