Marc E. Levitt, Kaushik Roy, Jacob A. Abraham. BiCMOS fault models: is stuck-at adequate?. In Proceedings of the 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 1990, Cambridge, MA, USA, 17-19 September, 1990. pages 294-297, IEEE, 1990. [doi]
Abstract is missing.