A New Laser System for X-Rays Flashes Sensitivity Evaluation - researchr publication authors

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D. Lewis, Hervé Lapuyade, Yann Deval, Y. Maidon, F. Darracq, R. Briand, Pascal Fouillat. A New Laser System for X-Rays Flashes Sensitivity Evaluation. In 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy. pages 111, IEEE Computer Society, 2001. [doi]

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