Adam W. Ley. Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
Abstract is missing.