Adam W. Ley. Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
Abstract is missing.