Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization

C. Leyris, F. Martinez, M. Valenza, A. Hoffmann, J. C. Vildeuil. Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization. Microelectronics Reliability, 47(4-5):573-576, 2007. [doi]

Authors

C. Leyris

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F. Martinez

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M. Valenza

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A. Hoffmann

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J. C. Vildeuil

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