C. Leyris, F. Martinez, M. Valenza, A. Hoffmann, J. C. Vildeuil. Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization. Microelectronics Reliability, 47(4-5):573-576, 2007. [doi]
@article{LeyrisMVHV07,
title = {Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization},
author = {C. Leyris and F. Martinez and M. Valenza and A. Hoffmann and J. C. Vildeuil},
year = {2007},
doi = {10.1016/j.microrel.2007.01.034},
url = {http://dx.doi.org/10.1016/j.microrel.2007.01.034},
tags = {C++},
researchr = {https://researchr.org/publication/LeyrisMVHV07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {4-5},
pages = {573-576},
}