A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with integer-to-current converter - researchr publication

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Brice Lhomme, Yann Carminati, Bertrand Borot, Olivier Callen, Thierry Burdeau, Sylvain Clerc. A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with integer-to-current converter. In 36th European Solid-State Circuits Conference, ESSCIRC 2010, Sevilla, Spain, September 13-17, 2010. pages 362-365, IEEE, 2010. [doi]

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