Jin-Fu Li. Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{Li23-141,
title = {Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability},
author = {Jin-Fu Li},
year = {2023},
doi = {10.1109/DFT59622.2023.10313537},
url = {https://doi.org/10.1109/DFT59622.2023.10313537},
researchr = {https://researchr.org/publication/Li23-141},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023},
editor = {Luca Cassano and Mihalis Psarakis and Marcello Traiola and Alberto Bosio},
publisher = {IEEE},
isbn = {979-8-3503-1500-4},
}