Jin-Fu Li. Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.