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Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences

B. Li, N. Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García. Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. Microelectronics Reliability, 51(9-11):1557-1560, 2011. [doi]

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B. Li

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N. Berbel

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Alexandre Boyer

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Sonia Bendhia

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Raúl Fernández-García

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